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2005 Volume 14 Issue 8
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Lin Xiao, He Xiao-Bo, Lu Jun-Ling, Gao Li, Huan Qing, Shi Dong-Xia, Gao Hong-Jun. 2005: Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems, Chinese Physics B, 14(8): 1536-1543.
Citation: Lin Xiao, He Xiao-Bo, Lu Jun-Ling, Gao Li, Huan Qing, Shi Dong-Xia, Gao Hong-Jun. 2005: Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems, Chinese Physics B, 14(8): 1536-1543.
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Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems

  • Nanoscale Physics and Devices Laboratory, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China

  • Available Online: 30/08/2005
  • Fund Project: the Chinese Academy of Sciences, the National High Technology Research and Development Program of China, the State Key Development Program for Basic Research of China, and the National Natural Science Foundation of China (Grant Nos 90
  • We demonstrate a special four-probe scanning tunnelling microscope (STM) system in ultrahigh vacuum (UHV),which can provide coarse positioning for every probe independently with the help of scanning electron microscope (SEM)and fine positioning down to nanometre using the STM technology. The system allows conductivity measurement by means of a four-point probe method, which can draw out more accurate electron transport characteristics in nanostructures, and provides easy manipulation of low dimension materials. All measurements can be performed in variable temperature (from 30K to 500K), magnetic field (from 0 to 0.1T), and different gas environments. Simultaneously, the cathodoluminescence (CL) spectrum can be achieved through an optical subsystem. Test measurements using some nanowire samples show that this system is a powerful tool in exploring electron transport characteristics and spectra in nanoscale physics.
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems

  • Available Online: 30/08/2005

Abstract: We demonstrate a special four-probe scanning tunnelling microscope (STM) system in ultrahigh vacuum (UHV),which can provide coarse positioning for every probe independently with the help of scanning electron microscope (SEM)and fine positioning down to nanometre using the STM technology. The system allows conductivity measurement by means of a four-point probe method, which can draw out more accurate electron transport characteristics in nanostructures, and provides easy manipulation of low dimension materials. All measurements can be performed in variable temperature (from 30K to 500K), magnetic field (from 0 to 0.1T), and different gas environments. Simultaneously, the cathodoluminescence (CL) spectrum can be achieved through an optical subsystem. Test measurements using some nanowire samples show that this system is a powerful tool in exploring electron transport characteristics and spectra in nanoscale physics.

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